An Improved <i>V</i> <sub>CE</sub> – <i>E</i> <sub>OFF</sub> Tradeoff and Snapback-Free RC-IGBT With P⁺ Pillars
Xiaodong Zhang, Ying Wang, Xue Wu, Meng-Tian Bao, Chenghao Yu, Fei Cao
Abstract
In this article, a novel snapback-free reverseconducting insulated-gate bipolar transistor (RC-IGBT) with P+ pillars at the collector side (PPC) is proposed and investigated by TCAD simulations. This structure features the P+ pillar structure at the side of collector and exits a gap of N-buffers above N+ collector. The P+ pillars increase the distributed resistance below the buffer layer during turnon transient, show bipolar mode, and eliminate the snapback phenomenon. Accordingly, the structure eliminates the snapback phenomenon with a smaller half-cell pitch of 10 μm, making that the device is more reliable and suitable for parallel connection. For the same forward voltage drop, the turn-off loss of the PPC structure is reduced by 34%.