Cargo vessel coupled deck panel stresses reliability study
Oleg Gaidai, Jingxiang Xu, Yihan Xing, Qingsong Hu, Gaute Storhaug, Xiaosen Xu, Jiayao Sun
Topics & Concepts
DeckReliability (semiconductor)Structural engineeringEngineeringMarine engineeringStress (linguistics)Forensic engineeringPhysicsPhilosophyQuantum mechanicsLinguisticsPower (physics)Structural Integrity and Reliability AnalysisFatigue and fracture mechanicsEngineering Structural Analysis Methods