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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti, Matteo Cecchetto, Jialei Wang, Maris Tali, P. Fernandéz Martinéz, Maria Kastriotou, Athina Papadopoulou, Kacper Biłko, Florent Castellani, Mario Sacristan, Rubén García Alía, Carlo Cazzaniga, Yolanda Morilla, Pedro Martín‐Holgado, Marc‐Jan van Goethem, Harry Kiewiet, Emil van der Graaf, S. Brandenburg, Wojtek Hajdas, Laura Sinkunaite, Mirosław Marszalek, H. Kettunen, Mikko Rossi, Jukka Jaatinen, Arto Javanainen, Marie-Hélène Moscatello, Anthony Dubois, S. Fiore, G. Bazzano, Christopher Frost, Manon Létiche, Wilfrid Farabolini, Antonio Gilardi, R. Corsini, H. Puchner

2020221 citationsDOIOpen Access PDF

Abstract

The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.

Topics & Concepts

Static random-access memoryLarge Hadron ColliderHigh energyNuclear physicsCharacterization (materials science)Heavy ionNuclear engineeringPhysicsIonMaterials scienceEngineeringElectrical engineeringEngineering physicsNanotechnologyQuantum mechanicsRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below | Litcius