Electromechanical analysis of direct and converse flexoelectric effects under a scanning probe tip
Wenyuan Liu, Feng Deng, Shaoxiong Xie, Shengping Shen, Jiangyu Li
Topics & Concepts
FlexoelectricityPiezoresponse force microscopyPiezoelectricityMaterials scienceFinite element methodPolarization (electrochemistry)DielectricFerroelectricityElectric fieldConverseCondensed matter physicsScanning probe microscopyMechanicsPhysicsNanotechnologyComposite materialOptoelectronicsGeometryChemistryMathematicsQuantum mechanicsThermodynamicsPhysical chemistryNonlocal and gradient elasticity in micro/nano structuresFerroelectric and Piezoelectric MaterialsForce Microscopy Techniques and Applications