Numerical analysis of the reliability of photovoltaic modules based on the fatigue life of the copper interconnects
Shahzada Pamir Aly, S. Ahzi, Nicolas Barth, Amir Abdallah
Topics & Concepts
Photovoltaic systemMaterials scienceReliability (semiconductor)LaminationStress (linguistics)ThermalResidual stressThermal expansionFinite element methodWork (physics)Structural engineeringComputer scienceMechanical engineeringComposite materialPower (physics)ThermodynamicsElectrical engineeringEngineeringLinguisticsPhilosophyPhysicsLayer (electronics)Silicon Carbide Semiconductor TechnologiesSilicon and Solar Cell TechnologiesElectronic Packaging and Soldering Technologies