The effect of cadmium impurities in the (PVP–TeO2) interlayer in Al/p-Si (MS) Schottky barrier diodes (SBDs): Exploring its electrophysical parameters
Gholamreza Pirgholi‐Givi, Ş. Altındal, Mehdi Shahedi Asl, Abbas Sabahi Namini, Javid Farazin, Yashar Azizian‐Kalandaragh
Topics & Concepts
ImpurityMaterials scienceSchottky barrierEquivalent series resistanceAnalytical Chemistry (journal)Schottky diodeDiodeConductivityNanostructureActivation energyChemistryNanotechnologyVoltageOptoelectronicsPhysical chemistryElectrical engineeringOrganic chemistryEngineeringChromatographySemiconductor materials and interfacesIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and devices