Litcius/Paper detail

A Dual-Polarimetric High Range Resolution Profile Modulation Method Based on Time-Modulated APCM

Ran Sui, Junjie Wang, Guang Sun, Zhiming Xu, Dejun Feng

2025IEEE Transactions on Antennas and Propagation34 citationsDOI

Abstract

The discovery of electromagnetic (EM) metasurfaces has significantly advanced the free manipulation of EM waves. Furthermore, the harmonic phenomena based on time-modulated metasurfaces (TMMs) have received much attention in communication and radar detection applications, which can reduce the efficiency of radar target detection. However, the existing research on time-varying metasurface has neglected its potential to manipulate the scattering characteristics of polarized radar targets. When a linear polarization wave is incident on a metasurface, it will be reflected into two orthogonal polarization states of EM waves, thus directly affecting the polarized scattering of the target. Active polarization conversion metasurfaces (APCMs) can manipulate the polarization of EM waves, aligning well with polarimetric radar. In this work, a dual-polarization radar target feature manipulation (Pol-TFM) method based on APCM is proposed, which enables manipulation of the harmonic and energy distribution of radar echo signals in multiple polarization channels. Through this processing, virtual targets generated by harmonic effects become observable on the dual-polarized high-resolution range profile (HRRP). This method also allows for the position manipulation of the virtual targets. Finally, echo signal experiments are conducted in dual-polarimetric channels to verify the effectiveness of the proposed method.

Topics & Concepts

PolarimetryModulation (music)Dual (grammatical number)Range (aeronautics)Remote sensingResolution (logic)OpticsComputer sciencePhysicsMaterials scienceAcousticsGeologyArtificial intelligenceScatteringLiteratureArtComposite materialSynthetic Aperture Radar (SAR) Applications and TechniquesInfrared Target Detection MethodologiesOptical Systems and Laser Technology