Robust Quantum Gates against Correlated Noise in Integrated Quantum Chips
Kangyuan Yi, Yong-Ju Hai, Kai Luo, Ji Chu, Libo Zhang, Yuxuan Zhou, Yao Song, Song Liu, Tongxing Yan, Xiu–Hao Deng, Yuanzhen Chen, Dapeng Yu
Abstract
As quantum circuits become more integrated and complex, additional error sources that were previously insignificant start to emerge. Consequently, the fidelity of quantum gates benchmarked under pristine conditions falls short of predicting their performance in realistic circuits. To overcome this problem, we must improve their robustness against pertinent error models besides isolated fidelity. Here, we report the experimental realization of robust quantum gates in superconducting quantum circuits based on a geometric framework for diagnosing and correcting various gate errors. Using quantum process tomography and randomized benchmarking, we demonstrate robust single-qubit gates against quasistatic noise and spatially correlated noise in a broad range of strengths, which are common sources of coherent errors in large-scale quantum circuits. We also apply our method to nonstatic noises and to realize robust two-qubit gates. Our Letter provides a versatile toolbox for achieving noise-resilient complex quantum circuits.