Litcius/Paper detail

Detecting anomalies in X-ray diffraction images using convolutional neural networks

Adam Czyzewski, Faustyna Krawiec, Dariusz Brzeziński, Przemyslaw Porebski, W. Minor

2021Expert Systems with Applications15 citationsDOIOpen Access PDF

Topics & Concepts

Benchmark (surveying)Convolutional neural networkComputer scienceAnomaly detectionDiffractionArtificial intelligencePattern recognition (psychology)Anomaly (physics)Image (mathematics)Set (abstract data type)OpticsPhysicsGeologyCondensed matter physicsGeodesyProgramming languageEnzyme Structure and FunctionMetabolomics and Mass Spectrometry StudiesMachine Learning in Materials Science