Dynamic weight-based accelerated test modeling for fault degradation and lifetime analysis
Ningyun Lu, Shoujin Huang, Yang Li, Bin Jiang, Okyay Kaynak, Enrico Zio
Topics & Concepts
Accelerated life testingDegradation (telecommunications)Reliability engineeringComputer scienceStochastic processProcess (computing)Stochastic modellingFault (geology)Stress testing (software)EngineeringMathematicsStatisticsWeibull distributionOperating systemGeologySeismologyTelecommunicationsProgramming languageReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design