Back to the basics of time-of-flight secondary ion mass spectrometry data analysis of bio-related samples. II. Data processing and display
Daniel J. Graham, Lara J. Gamble
Abstract
This is the second half of a two-part Tutorial on the basics of the time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of bio-related samples. Part I of this Tutorial series covers planning for a ToF-SIMS experiment, preparing and shipping samples, and collecting ToF-SIMS data. This Tutorial aims at helping the ToF-SIMS user to process, display, and interpret ToF-SIMS data. ToF-SIMS provides detailed chemical information about surfaces but comes with a steep learning. The purpose of this Tutorial is to provide the reader with a solid foundation in the ToF-SIMS data analysis.
Topics & Concepts
Secondary ion mass spectrometryTime of flightMass spectrometryChemistryStatic secondary-ion mass spectrometryIonAnalytical Chemistry (journal)ChromatographyOrganic chemistryIon-surface interactions and analysisAnalytical chemistry methods developmentMass Spectrometry Techniques and Applications