A self-supervised learning framework based on masked autoencoder for complex wafer bin map classification
Yi Wang, Dong Ni, Zhenyu Huang, Puyang Chen
Topics & Concepts
AutoencoderComputer scienceArtificial intelligenceClassifier (UML)Supervised learningBinEncoderBinary classificationPattern recognition (psychology)Data miningDeep learningMachine learningArtificial neural networkSupport vector machineAlgorithmOperating systemIndustrial Vision Systems and Defect DetectionAdvancements in Photolithography TechniquesIntegrated Circuits and Semiconductor Failure Analysis