A PVT-Robust AFE-Embedded Error-Feedback Noise-Shaping SAR ADC With Chopper-Based Passive High-Pass IIR Filtering for Direct Neural Recording
Kyeongwon Jeong, Yoontae Jung, Gichan Yun, Donghyun Youn, Yehhyun Jo, Hyunjoo J. Lee, Sohmyung Ha, Minkyu Je
Abstract
This paper presents a PVT-robust error-feedback (EF) noise-shaping SAR (NS-SAR) ADC for direct neural-signal recording. For closed-loop bidirectional neural interfaces enabling the next generation neurological devices, a wide-dynamic-range neural recording circuit is required to accommodate stimulation artifacts. A recording structure using an NS-SAR ADC can be a good candidate because the high resolution and wide dynamic range can be obtained with a low oversampling ratio and power consumption. However, NS-SAR ADCs require an additional gain stage to obtain a well-shaped noise transfer function (NTF), and a dynamic amplifier is often used as the gain stage to minimize power overhead at the cost of vulnerability to PVT variations. To overcome this limitation, the proposed work reutilizes the capacitive-feedback amplifier, which is the analog front-end of the neural recording circuit, as a PVT-robust gain stage to achieve a reliable NS performance. In addition, a new chopper-based implementation of a passive high-pass IIR filter is proposed, achieving an improved NTF compared to prior EF NS-SAR ADCs. Fabricated in a 180-nm CMOS process, the proposed NS-SAR ADC consumes 4.3-μW power and achieves a signal-to-noise-and-distortion ratio (SNDR) of 71.7 dB and 82.7 dB for a bandwidth of 5 kHz and 300 Hz, resulting in a Schreier figure of merit (FOM) of 162.4 dB and 162.1 dB, respectively. Direct neural recording using the proposed NS-SAR ADC is demonstrated successfully in vivo, and also its tolerance against stimulation artifacts is validated in vitro.