Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy
Zhaomin Peng, Dehai Zhang, Shuqi Ge, Jin Meng
Abstract
Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical issues has become a popular topic in THz s-SNOM research. In this study, a finite element model (FEM) is proposed to quantify the near-field interactions, and to investigate the edge effect and antenna effect in THz s-SNOM. Our results indicate that the proposed model can give us a better understanding of the near-field interactions and direct the parameter design of the probe for THz s-SNOM.
Topics & Concepts
Terahertz radiationNear-field scanning optical microscopeOptical microscopeOpticsNear and far fieldField (mathematics)Antenna (radio)MicroscopyMaterials sciencePhysicsComputer scienceTelecommunicationsScanning electron microscopePure mathematicsMathematicsNear-Field Optical MicroscopyPlasmonic and Surface Plasmon ResearchMicrowave Engineering and Waveguides