An Experimental Method for Stereo-DIC Measurement of Large-Scale Thin-Film Structures
K. Wei, Gaosheng Wei, Xinxing Shao, D. P. Jin, Xuecheng He
Topics & Concepts
Speckle patternThin filmMaterials scienceDigital image correlationOpticsVibrationComputer scienceAcousticsPhysicsComposite materialNanotechnologyOptical measurement and interference techniquesAdvanced Vision and ImagingSurface Roughness and Optical Measurements