Automated structure discovery in atomic force microscopy
Benjamin Alldritt, Prokop Hapala, Niko Oinonen, Fedor Urtev, Ondrej Krejci, Filippo Federici Canova, Juho Kannala, Fabian Schulz, Peter Liljeroth, Adam S. Foster
Abstract
-camphor on Cu(111) based on low-temperature AFM measurements. This approach will open the door to applying high-resolution AFM to a large variety of systems, for which routine atomic and chemical structural resolution on the level of individual objects/molecules would be a major breakthrough.
Topics & Concepts
Atomic force microscopyPlanarNanotechnologyMoleculeMaterials scienceResolution (logic)Conductive atomic force microscopyMicroscopyAdsorptionChemical physicsHigh resolutionAtomic unitsSet (abstract data type)Interpretation (philosophy)AngstromOrganic moleculesChemistryComputer scienceNanoscopic scaleBiological systemForce Microscopy Techniques and ApplicationsMachine Learning in Materials ScienceAdvanced Electron Microscopy Techniques and Applications