Litcius/Paper detail

Finite element method modeling of temperature gradient-induced Cu atomic thermomigration in Cu/Sn/Cu micro solder joint

Tianyue Bai, Yuanyuan Qiao, Xudong Wang, Ning Zhao

2022Microelectronics Reliability19 citationsDOI

Topics & Concepts

SolderingIntermetallicMaterials scienceJoint (building)Finite element methodTemperature gradientDiffusionMetallurgyFlux (metallurgy)Steady state (chemistry)CopperComposite materialThermodynamicsChemistryStructural engineeringPhysical chemistryAlloyEngineeringPhysicsQuantum mechanicsElectronic Packaging and Soldering TechnologiesIntermetallics and Advanced Alloy Properties3D IC and TSV technologies
Finite element method modeling of temperature gradient-induced Cu atomic thermomigration in Cu/Sn/Cu micro solder joint | Litcius