High efficiency and stability of ink-jet printed quantum dot light emitting diodes
Chaoyu Xiang, Longjia Wu, Zizhe Lu, Menglin Li, Yanwei Wen, Yixing Yang, Wenyong Liu, Ting Zhang, Weiran Cao, Sai‐Wing Tsang, Bin Shan, Xiaolin Yan, Lei Qian
Abstract
The low efficiency and fast degradation of devices from ink-jet printing process hinders the application of quantum dot light emitting diodes on next generation displays. Passivating the trap states caused by both anion and cation under-coordinated sites on the quantum dot surface with proper ligands for ink-jet printing processing reminds a problem. Here we show, by adapting the idea of dual ionic passivation of quantum dots, ink-jet printed quantum dot light emitting diodes with an external quantum efficiency over 16% and half lifetime of more than 1,721,000 hours were reported for the first time. The liquid phase exchange of ligands fulfills the requirements of ink-jet printing processing for possible mass production. And the performance from ink-jet printed quantum dot light emitting diodes truly opens the gate of quantum dot light emitting diode application for industry.