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On noise-induced transient bit flips in subthreshold SRAM

Léopold Van Brandt, Fernando Silveira, Jean‐Charles Delvenne, Denis Flandre

2023Solid-State Electronics11 citationsDOIOpen Access PDF

Topics & Concepts

SpiceFlicker noiseStatic random-access memoryElectronic engineeringInverterTransient (computer programming)Noise (video)CMOSSubthreshold conductionComputer scienceMean time between failuresTransistorElectrical engineeringVoltageEngineeringReliability engineeringNoise figureFailure rateArtificial intelligenceAmplifierOperating systemImage (mathematics)Low-power high-performance VLSI designAdvancements in Semiconductor Devices and Circuit Design
On noise-induced transient bit flips in subthreshold SRAM | Litcius