Physicochemical insights into semiconductor properties of a semitransparent tantalum nitride photoanode for solar water splitting
Tomohiro Higashi, Hiroshi Nishiyama, Yuriy Pihosh, Kaisei Wakishima, Yudai Kawase, Yutaka Sasaki, Akira Nagaoka, Kenji Yoshino, Kazuhiro Takanabe, Kazunari Domen
Abstract
thin films were investigated using X-ray photoelectron spectroscopy as a means of evaluating surface oxygen impurities and nitrogen vacancies, which may correlate with the PEC OER performance and the electrical properties of the material.
Topics & Concepts
Tantalum nitrideSemiconductorMaterials scienceOptoelectronicsTantalumQuartzLayer (electronics)NitrideSolar cellElectrical conductorConductivitySubstrate (aquarium)NanotechnologyEngineering physicsComposite materialChemistryMetallurgyGeologyEngineeringPhysical chemistryOceanographyAdvanced Photocatalysis TechniquesElectronic and Structural Properties of OxidesSemiconductor materials and devices