Frequency and temperature dependence of dielectric properties and capacitance–voltage in GO/TiO2/n-Si MOS device
A. Ashery, S. A. Gad, H. Shaban
Topics & Concepts
CapacitanceMaterials scienceDielectricFrequency dependenceOptoelectronicsVoltageCondensed matter physicsAnalytical Chemistry (journal)Electrical engineeringChemistryPhysicsNuclear magnetic resonanceElectrodeEngineeringPhysical chemistryChromatographySemiconductor materials and devicesSemiconductor materials and interfacesSilicon Nanostructures and Photoluminescence