Development of LGAD sensors with a thin entrance window for soft X-ray detection
Jiaguo Zhang, R. Barten, F. Baruffaldi, A. Bergamaschi, G. Borghi, M. Boscardin, Martin Brückner, M. Carulla, M. Centis Vignali, R. Dinapoli, Simon Ebner, F. Ficorella, E. Fröjj ̈dh, D. Greiffenberg, O. Hammad Alì, J. Heymes, S. Hasanaj, V. Hinger, Tsu‐Jae King, Pawel Kozłowski, C. Lopez-Cuenca, D. Mezza, Κωνσταντίνος Μουστάκας, A. Mozzanica, G. Paternoster, S. Ronchin, C. Ruder, B. Schmitt, D. Thattil
Abstract
Abstract We show the developments carried out to improve the silicon sensor technology for the detection of soft X-rays with hybrid X-ray detectors. An optimization of the entrance window technology is required to improve the quantum efficiency. The LGAD technology can be used to amplify the signal generated by the X-rays and to increase the signal-to-noise ratio, making single photon resolution in the soft X-ray energy range possible. In this paper, we report first results obtained from an LGAD sensor production with an optimized thin entrance window. Single photon detection of soft X-rays down to 452 eV has been demonstrated from measurements, with a signal-to-noise ratio better than 20.