Extracting the inherent ideality factor of a diode from electrical current–voltage characteristics
Jaehyeok Park, Chaeyoon Yu, Sangjin Min, Jong‐In Shim, Dong‐Soo Shin
Abstract
Abstract The ideality factor of a diode gives the information on the current conduction or recombination processes occurring inside the device. The ideality factor obtained from the electrical current–voltage ( I–V ) characteristics by the conventional method is typically masked by the effect of the series resistance at high currents. In this study, from a careful analysis of the I–V characteristics, a new formula that can extract the inherent ideality factor without the effect of the series resistance is presented and experimentally tested with a blue light‐emitting diode. The new ideality factor thus obtained is compared with the one by the photovoltaic measurement.
Topics & Concepts
Equivalent series resistanceDiodeCurrent (fluid)OptoelectronicsMaterials scienceVoltagePhotovoltaic systemSeries (stratigraphy)Electrical engineeringEngineeringPaleontologyBiologyGaN-based semiconductor devices and materialsSemiconductor materials and interfacesSemiconductor Quantum Structures and Devices