Radiation-induced degradation of silicon carbide MOSFETs – A review
Tamana Baba, Naseeb Ahmed Siddiqui, Norazlina Bte Saidin, Siti Harwani Md Yusoff, S.F. Abdul Sani, Julia Abdul Karim, Nurul Fadzlin Hasbullah
Topics & Concepts
Materials scienceSilicon carbideMOSFETOptoelectronicsTransistorRadiationEngineering physicsRadiation damageThreshold voltageReliability (semiconductor)Radiation resistanceVoltageElectrical engineeringPhysicsEngineeringPower (physics)OpticsMetallurgyQuantum mechanicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesRadiation Effects in Electronics