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Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)

Quentin Gibaru, C. Inguimbert, Pablo Caron, M. Raine, Damien Lambert, J. Puech

2020Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms31 citationsDOIOpen Access PDF

Topics & Concepts

KaptonElectronSecondary electronsIonMaterials scienceSiliconAtomic physicsSecondary emissionPhysicsNuclear physicsNanotechnologyMetallurgyPolyimideQuantum mechanicsLayer (electronics)Electron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence AnalysisAtomic and Molecular Physics
Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2) | Litcius