Utilization of conventional PXRD apparatus for characterization of thin-films using reconsidered equations for XRR
Vilko Mandić, Stanislav Kurajica, Ivana Panžić, Arijeta Bafti, Juraj Šipušić, Katarina Mužina, Filip Brleković, Lara Gigli, Mattia Gaboardi
Topics & Concepts
X-ray reflectivityMaterials scienceThin filmPowder diffractionMonolayerCharacterization (materials science)EllipsometryOpticsAnalytical Chemistry (journal)CrystallographyNanotechnologyOrganic chemistryChemistryPhysicsX-ray Diffraction in CrystallographySurface and Thin Film PhenomenaMagnetic Properties and Applications