Study of optical parameters of Te(1-x) (GeSe0.5) Scx (0 ≤ x ≤ 0.15) thin films for optical data storage applications
Surbhi Agarwal, Pooja Lohia, D. K. Dwivedi
Topics & Concepts
Refractive indexThin filmMolar absorptivityBand gapMaterials scienceDielectricAnalytical Chemistry (journal)Attenuation coefficientAbsorption (acoustics)Dissipation factorOpticsAbsorption spectroscopyOptoelectronicsChemistryNanotechnologyPhysicsChromatographyComposite materialPhase-change materials and chalcogenidesChalcogenide Semiconductor Thin FilmsNonlinear Optical Materials Research