Characterization and stability monitoring of X-ray focal spots
Gabriel Probst, Qinhan Hou, Bart Boeckmans, Yongshun Xiao, Wim Dewulf
Topics & Concepts
SpotsCharacterization (materials science)OpticsX-rayMaterials sciencePhysicsChemistryPhysical chemistryAdvanced X-ray and CT ImagingMedical Imaging Techniques and ApplicationsAdvanced X-ray Imaging Techniques