Metric for quantifying elastic and inelastic thermal transport at interfaces
Yixin Xu, Yanguang Zhou
Abstract
Quantifying elastic and inelastic phonon scattering at interfaces is critical for designing corresponding devices with desired thermal properties. However, a general metric for quickly characterizing the contributions to interfacial thermal conductance from elastic and inelastic phonon scattering processes is lacking. Here, the authors introduce a general metric based on the Kullback-Leibler divergence and interfacial anharmonic ratio to quickly assess the contributions to interfacial thermal conductance from elastic and inelastic phonon scattering.
Topics & Concepts
Metric (unit)ThermalMaterials scienceComputer sciencePhysicsThermodynamicsEngineeringOperations managementThermal properties of materialsComposite Material MechanicsMachine Learning in Materials Science