High-resolution FIB-TEM-STEM structural characterization of grain boundaries in the high dielectric constant perovskite CaCu3Ti4O12
B. Domengès, Guillaume Riquet, Sylvain Marinel, Christelle Harnois
Topics & Concepts
Materials scienceGrain boundaryCrystalliteScanning transmission electron microscopyHigh-resolution transmission electron microscopyFocused ion beamElectron energy loss spectroscopyDielectricCeramicGrain growthPerovskite (structure)Grain sizeTransmission electron microscopyAnalytical Chemistry (journal)MicrostructureComposite materialCrystallographyNanotechnologyMetallurgyOptoelectronicsIonChemistryOrganic chemistryChromatographyDielectric properties of ceramicsFerroelectric and Piezoelectric MaterialsMultiferroics and related materials