An improved steady-state method for measuring the thermal contact resistance and bulk thermal conductivity of thin-walled materials having a sub-millimeter thickness
Biao Feng, Jing Tu, Yuhong Zhang, Li‐Wu Fan, Zitao Yu
Topics & Concepts
Materials scienceThermal conductivityComposite materialThermal contact conductanceThin filmThermal conductivity measurementLaserMillimeterThermal resistanceThermalOptoelectronicsOpticsNanotechnologyMeteorologyPhysicsThermal properties of materialsAdhesion, Friction, and Surface InteractionsHeat Transfer and Optimization