Litcius/Paper detail

Assessment of the levels of damage caused by Fusarium head blight in wheat using an improved YoloV5 method

Dongyan Zhang, Han-Sen Luo, Daoyong Wang, Xin‐Gen Zhou, Weifeng Li, Chunyan Gu, Gan Zhang, Fang-Ming He

2022Computers and Electronics in Agriculture64 citationsDOI

Topics & Concepts

SegmentationArtificial intelligencePattern recognition (psychology)Feature (linguistics)Computer scienceObject detectionFeature extractionClassifier (UML)Computer visionImage segmentationPhilosophyLinguisticsSpectroscopy and Chemometric AnalysesSmart Agriculture and AIPlant Pathogens and Fungal Diseases