Litcius/Paper detail

Meta-QTL analysis of tan spot resistance in wheat

Yuan Liu, Evan Salsman, Runhao Wang, Nelomie Galagedara, Qijun Zhang, Jason D. Fiedler, Zhaohui Liu, Steven S. Xu, Justin D. Faris, Xuehui Li

2020Theoretical and Applied Genetics93 citationsDOI

Topics & Concepts

Quantitative trait locusBiologyFamily-based QTL mappingGeneticsPlant disease resistanceGenetic linkageCultivarPyrenophoraLinkage (software)Doubled haploidyAgronomyGene mappingGeneChromosomeWheat and Barley Genetics and PathologyGenetic Mapping and Diversity in Plants and AnimalsGenetics and Plant Breeding