Litcius/Paper detail

Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters

Yosef Badalı, Yashar Azizian‐Kalandaragh, İbrahım Uslu, Ş. Altındal

2020Journal of Materials Science Materials in Electronics17 citationsDOI

Topics & Concepts

Materials scienceSchottky diodeSemiconductorSchottky barrierDiodeFabricationEquivalent series resistanceInsulator (electricity)Thin filmMetalAnalytical Chemistry (journal)OptoelectronicsNanotechnologyVoltageElectrical engineeringMetallurgyChemistryAlternative medicineMedicinePathologyChromatographyEngineeringSemiconductor materials and interfacesSilicon Carbide Semiconductor TechnologiesChalcogenide Semiconductor Thin Films
Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters | Litcius