IBIC analysis of SiC detectors developed for fusion applications
M. C. Jiménez-Ramos, J. Garcı́a López, A. García Osuna, M. Rodríguez-Ramos, A. Villalpando Barroso, M. García-Muñoz, E. Andrade, G. Pellegrini, Sofía Otero Ugobono, Philippe Godignon, J.M. Rafı́, Gemma Rius
Topics & Concepts
MicroprobeMaterials scienceFluenceIrradiationNuclear fusionBiasingDetectorIonAlpha particleOptoelectronicsIon beamDiffusionAnalytical Chemistry (journal)Atomic physicsVoltageBeam (structure)OpticsNuclear physicsPhysicsChemistryThermodynamicsChromatographyQuantum mechanicsSilicon and Solar Cell TechnologiesIon-surface interactions and analysisSilicon Carbide Semiconductor Technologies