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Total ionizing dose effects on nanosheet and nanowire field effect transistors

Jin‐Woo Han, Jungsik Kim, M. Meyyappan

2021Microelectronics Reliability13 citationsDOI

Topics & Concepts

NanosheetShallow trench isolationMaterials scienceTrap (plumbing)Field-effect transistorTransistorAbsorbed doseOptoelectronicsDielectricGate dielectricReliability (semiconductor)TrenchGate oxideElectronic engineeringElectrical engineeringNanotechnologyRadiationEngineeringPhysicsOpticsVoltageLayer (electronics)Quantum mechanicsPower (physics)Environmental engineeringSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignRadiation Effects in Electronics
Total ionizing dose effects on nanosheet and nanowire field effect transistors | Litcius