Spectroscopic ellipsometry as a route to thermodynamic characterization
Ronald P. White, Dragos Buculei, Alexia M. J. M. Beale, Ilias Goovaerts, Joseph L. Keddie, Jane E. G. Lipson
Abstract
itself. Spectroscopic ellipsometry, which requires only very small quantities of sample and is straightforward to perform, will significantly expand the range of systems for which thermodynamic properties can be characterized. It will thus advance our ability to use theory and modeling to predict the miscibility and dynamic relaxation of new materials. As such, ellipsometry will be able to underpin materials synthesis and property design.
Topics & Concepts
EllipsometryMaterials scienceCharacterization (materials science)Thermal expansionGlass transitionPolymerThermodynamicsThin filmMaterial propertiesNanotechnologyPhysicsComposite materialPhase Equilibria and ThermodynamicsMaterial Dynamics and PropertiesThermodynamic properties of mixtures