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Dynamic phase-differencing profilometry with number-theoretical phase unwrapping and interleaved projection

Zhimi Wei, Yiping Cao, Haitao Wu, Cai Xu, Guoshui Ruan, Fang Wu, Chengmeng Li

2024Optics Express77 citationsDOIOpen Access PDF

Abstract

High-speed 3D measurement is receiving increasing attention. However, simultaneously achieving high computational efficiency, algorithmic robustness, and reconstructing ratio is challenging. Therefore, a dynamic phase-differencing profilometry (DPDP) is proposed. By capturing the minimum three phase-shifting sinusoidal deformed patterns and establishing a brand-new model, the phase difference between the object on the reference plane and the reference plane is directly resolved to effectively improve computational efficiency. Although it is wrapped, by using only two auxiliary complementary gratings with a purposely designed lower frequency, a DPDP-based number-theoretical temporal phase unwrapping (NT-TPU) algorithm is also proposed to unwrap the wrapped phase difference rather than the phase itself with high robustness. Furthermore, compared to existing PSP-based NT-TPU, the proposed NT-TPU can normally work under more relaxed restrictions. In order to accomplish a high reconstructing ratio, a pentabasic interleaved projection (PIP) strategy based on time division multiplexing is proposed. It can improve the reconstructing ratio from one reconstruction per every five patterns to an equivalent of one reconstruction per every 1.67 patterns. Experimental results demonstrate that the proposed method achieves high computational efficiency, high algorithmic robustness, and high reconstructing ratio simultaneously and has prospective application in high-speed 3D measurement.

Topics & Concepts

Robustness (evolution)Structured-light 3D scannerProfilometerComputer scienceAlgorithmOpticsPhase (matter)Artificial intelligenceMaterials sciencePhysicsSurface roughnessGeneQuantum mechanicsComposite materialBiochemistryChemistryScannerOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesOptical Systems and Laser Technology