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On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs

Annachiara Ruospo, Ernesto Sánchez

2021Applied Sciences33 citationsDOIOpen Access PDF

Abstract

Nowadays, the usage of electronic devices running artificial neural networks (ANNs)-based applications is spreading in our everyday life. Due to their outstanding computational capabilities, ANNs have become appealing solutions for safety-critical systems as well. Frequently, they are considered intrinsically robust and fault tolerant for being brain-inspired and redundant computing models. However, when ANNs are deployed on resource-constrained hardware devices, single physical faults may compromise the activity of multiple neurons. Therefore, it is crucial to assess the reliability of the entire neural computing system, including both the software and the hardware components. This article systematically addresses reliability concerns for ANNs running on multiprocessor system-on-a-chips (MPSoCs). It presents a methodology to assign resilience scores to individual neurons and, based on that, schedule the workload of an ANN on the target MPSoC so that critical neurons are neatly distributed among the available processing elements. This reliability-oriented methodology exploits an integer linear programming solver to find the optimal solution. Experimental results are given for three different convolutional neural networks trained on MNIST, SVHN, and CIFAR-10. We carried out a comprehensive assessment on an open-source artificial intelligence-based RISC-V MPSoC. The results show the reliability improvements of the proposed methodology against the traditional scheduling.

Topics & Concepts

MPSoCComputer scienceArtificial neural networkReliability (semiconductor)ScheduleMultiprocessingFault toleranceEmbedded systemScheduling (production processes)Neuromorphic engineeringDistributed computingArtificial intelligenceComputer architectureSystem on a chipParallel computingEngineeringOperating systemPhysicsQuantum mechanicsPower (physics)Operations managementAdvanced Memory and Neural ComputingRadiation Effects in ElectronicsFerroelectric and Negative Capacitance Devices
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