Impact of temperature on analog/RF, linearity and reliability performance metrics of tunnel FET with ultra-thin source region
Prabhat Singh, Dharmendra Singh Yadav
Topics & Concepts
TransconductanceLinearityMaterials scienceGain–bandwidth productElectrical engineeringOptoelectronicsAmbipolar diffusionGain compressionSensitivity (control systems)Quantum tunnellingTransistorPhysicsElectronic engineeringVoltagePlasmaEngineeringAmplifierQuantum mechanicsOperational amplifierCMOSAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis