The robust fail-safe topological designs based on the von Mises stress
Hongxin Wang, Jie Liu, Guilin Wen, Yi Min Xie
Topics & Concepts
von Mises yield criterionTopology optimizationMathematical optimizationComputer scienceTopology (electrical circuits)Finite element methodNonlinear systemMathematicsStructural engineeringEngineeringPhysicsQuantum mechanicsCombinatoricsTopology Optimization in EngineeringAdvanced Multi-Objective Optimization AlgorithmsComposite Structure Analysis and Optimization